|
|||||
|
|
XPS Analysis of Bridgman-grown CuInTe2 and of its Native Oxide |
|
| Authors: | H Neumann M Mast J Enderlein R D Tomlinson M V Yakushev |
| Abstract: | X-ray excited photoelectron spectroscopy is used to analyse the near-surface properties of CuInTe2 single crystals grown by the vertical Bridgman method. It is found that keeping the crystals at room temperature in air for relatively short times is sufficient for the formation of an oxide layer which consists mainly of TeO2. No detectable amounts of copper or indium oxides could be observed. |
| Keywords: | |