Determination of trace elements in semiconductor materials by neutron activation analysis using the radioisotope addition technique |
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| Authors: | K Kobayashi K Kudo |
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| Institution: | (1) Ibaraki Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Tokai, Ibaraki, (Japan) |
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| Abstract: | The determination of trace elements in highly activated matrix components was carried out by neutron activation analysis using the radioisotope addition technique. The method is based on the addition to the irradiated test sample of a radioisotope which is a diffeent nuclide of the element to be determined. After separation, the chemical yield is calculated from the radioactivity added and the element is determined by an ordinary technique. Twelve elements in indium phosphide and eight elements in gallium arsenide could be determined by the method. |
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