Profilometry based on two-photon absorption in a silicon avalanche photodiode |
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| Authors: | Tanaka Yosuke Sako Naoya Kurokawa Takashi Tsuda Hiroyuki Takeda Mitsuo |
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| Institution: | Department of Electrical and Electronic Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei-shi, Tokyo 184-8588, Japan. tyosuke@cc.tuat.ac.jp |
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| Abstract: | A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach-Zehnder interferometer. |
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