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利用TFT-LCD像素结构衍射测试CCD图像采集系统的像素间距
引用本文:胡文刚,王永仲,华文深.利用TFT-LCD像素结构衍射测试CCD图像采集系统的像素间距[J].光子学报,2008,37(6):1242-1245.
作者姓名:胡文刚  王永仲  华文深
作者单位:军械工程学院,光学与电子工程系,石家庄,050003
摘    要:研究了在范德卢格特型光学相关器中利用薄膜晶体管液晶显示器(TFT-LCD)替代靶板实物测试CCD图像采集系统像素间距的原理和方法,对由HN-480型CCD摄像机和OK-C21型图像采集卡组成的图像采集系统像素间距进行了现场测试,并对测试结果进行了误差分析.结果表明,该方法充分利用了光学相关器的现有组件,不需要其它设备,保证了图像采集系统像素间距的测试结果和实际工作性能的一致性,具有很强的实用性和可操作性.

关 键 词:信息光学  范德卢格特相关器  TFT-LCD  像素间距  衍射
收稿时间:2006-11-16
修稿时间:2007-03-04

An Approach to Measure Pixel Pitch of CCD Camera System by Using Structure Diffraction of TFT-LCD
HU Wen-gang,WANG Yong-zhong,HUA Wen-shen.An Approach to Measure Pixel Pitch of CCD Camera System by Using Structure Diffraction of TFT-LCD[J].Acta Photonica Sinica,2008,37(6):1242-1245.
Authors:HU Wen-gang  WANG Yong-zhong  HUA Wen-shen
Abstract:An approach of measuring the pixel pitch of CCD Camera System is presented by using the diffraction of TFT-LCD structure in VanderLugt optical correlator.Its principle and testing method are studied and a typical of CCD camera system consisted of HN-480 model CCD sensor and OK-C21 model image grasp board is tested.The way did not need extra independent test bed and is suitable for VanderLugt correlator.The measurement results for the pixel pitch of CCD camera system is agreeable to its operational performance.The result shows that this approach has very strong practicability and effectiveness.
Keywords:Information optics  Vander lugt correlator  TFT-LCD  Pixel pitch  Diffraction
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