| 低频连接器的载流设计及试验 |
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| 引用本文： | 寇秉成,孙华明. 低频连接器的载流设计及试验[J]. 光纤与电缆及其应用技术, 2014, 0(5): 11-14 |
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| 作者姓名： | 寇秉成 孙华明 |
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| 作者单位： | 中国电子科技集团公司第二十三研究所,上海201900 |
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| 摘 要： | 接触件的载流是低频连接器设计的关键,对连接器的使用寿命有重大影响。给出低频连接器载流设计方法,并通过相应电流试验方法加以验证。
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| 关 键 词： | 低频连接器 接触件载流设计 电流试验 |
Current-Carrying Design and Test of Low-Frequency Connectors |
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| Affiliation: | KOU Bingcheng, SHUN Huaming (The 23rd Research Institute, CETC, Shanghai 201900, China) |
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| Abstract: | The contact current-carrying is the key performance in the design of low-frequency connectors,it has significant impact on the service life of connectors.The method for designing the current-carrying of low-frequency connectors is presented,and verified based on corresponding current testing method. |
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| Keywords: | low-frequency connector contact current-carrying design current test |
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