Growth of CdSiP2 single crystals by self-seeding vertical Bridgman method

Using a high purity CdSiP₂ polycrystalline charge synthesized in a single-temperature zone furnace, a CdSiP₂ single crystal with dimensions of 8 mm in diameter and 40 mm in length was successfully grown by the vertical Bridgman method. The quality of the crystal was characterized by high resolution X-ray diffraction and the full width at half maximum (FWHM) of the rocking curve for the (200) face is 33″. Thermal property measurements show that: the mean specific heat of CdSiP₂ between 300 and 773 K is 0.476 J g^?1 K^?1; the thermal conductivity of the crystal along the a- and c-axes is 13.6 W m^?1 K^?1 and 13.7 W m^?1 K^?1 at 295 K, respectively; and the thermal expansion coefficient measured along the a- and c-axes is 8.4×10^?6 K^?1 and ?2.4×10^?6 K^?1, respectively. The optical transparency range of the crystal is 578–10,000 nm, and there is no absorption loss in the spectrum from 0.7 to 2.5 μm, as often exists with ZnGeP₂ crystals grown from the melt.