Atomic Layer Deposited Ti2O3 Thin Films |
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Authors: | Dr K Manjunath A Saraswat Dr D Samrat Prof C N R Rao |
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Institution: | International Centre for Materials Science, New Chemistry Unit, School of Advanced Materials, Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur P.?O., Bengaluru, 560064 India |
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Abstract: | Ti2O3 thin films have been prepared through atomic layer deposition and subjected to electrical resistivity measurements as a function of temperature. The as-prepared films were stable for up to three weeks. In Ti2O3 thin films, the insulator-metal transition is observed at ~80 K, with nearly 3–4 orders of magnitude change in resistivity. The anomalous increase in electrical resistivity in the films is in accordance with the two-band model. However, the energy interval between the bands depending on the crystallographic c/a ratio leads to a change in electrical resistivity as a function of temperature. |
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Keywords: | Ti2O3 insulator-metal transition atomic layer deposition corundum structure thin films |
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