Homogenitätsuntersuchungen und Bestimmung der molaren Konzentration x an CdxHg1–xTe mit Hilfe der Elektronenstrahlmikrosonde

The semiconductor Cd_xHg_1–xTe serves as a starting material for the production of infrared detectors with a high detectivity and a small time constant. Cd_xHg_1–xTe single crystals are necessary to manufacture detectors efficiently. The single crystals should not contain segregations and have to include a homogeneous molar concentration x. An electron microprobe X-ray analyzer meets all requirements expected from the measuring method for checking the homogeneity of Cd_xHg_1–xTe crystals. — Results of qualitative and quantitative studies in the microscopical and macroscopical range are presented. Typical defects of the crystals were detected by using the qualitative electron microprobe X-ray analysis. The quantitative analysis was carried out with standard samples. The method for determination of the molar concentration x of the standard samples is described.