Development of a method for direct determination of solids as thin films by energy dispersive X-ray fluorescence analysis |
| |
Authors: | Knut Bächmann Kerstin Steigerwald Helmut Klenk |
| |
Affiliation: | (1) Fachbereich Chemie, Technische Hochschule Darmstadt, D-W 6100 Darmstadt, Federal Republic of Germany |
| |
Abstract: | Solid samples can be analysed as without a prior decomposition step, if they are pulverized and then embedded in a thin layer of a cold-setting polymer. This method is very appropriate for materials which are difficult to decompose or which can be easily contaminated. The sample components are evenly distributed in a thin layer, which improves considerably the signal-tonoise-ratio, and this leads to a decrease of the limits of detection. The reproducibility of the method was tested with cobalt oxide and yttrium oxide and also a mixture of these with silver oxide and manganese dioxide. Between 20 and 60 ng of these elements can be determined without difficulty, with a precision of ± 2–4%. The correlation coefficients found for the calibration graphs were between 0.994 and 0.999. |
| |
Keywords: | EDXRF analysis thin layer cold-setting polymer |
本文献已被 SpringerLink 等数据库收录! |