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| 基于模拟集成电路BIST的ARMA模块设计 | |
| 引用本文： | 鞠家欣,姜岩峰,于韶光. 基于模拟集成电路BIST的ARMA模块设计[J]. 电子测试, 2010, 0(2): 56-62 |
| 作者姓名： | 鞠家欣 姜岩峰 于韶光 |
| 作者单位： | 1. 北方工业大学信息工程学院微电子中心,北京,100041 2. 北方工业大学信息工程学院微电子中心,北京,100041;北京自动测试技术研究所,北京,100088 3. 北京自动测试技术研究所,北京,100088 |
| 摘 要： | 针对模拟集成电路在线测试困难的特点，本文基于BIST结构对模拟集成电路的测试提出了一种新的测试方案，这种算法在测试电路中易于实现，并且容易嵌入到待测芯片中，为模拟集成电路可测试性设计提出了一种新的测试结构和测试算法。 |
| 关 键 词： | 模拟集成电路 BIST ARMA模块 |
Design of ARMA module based on bist technology of analog integrated circuit |
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| Ju Jiaxin,Jiang Yanfeng,Yu Shaoguang. Design of ARMA module based on bist technology of analog integrated circuit[J]. Electronic Test, 2010, 0(2): 56-62 | |
| Authors: | Ju Jiaxin Jiang Yanfeng Yu Shaoguang |
| Affiliation: | 1Microelectronic Center, College of Information Engineering, North China University of Technology, Beijing 100144,China ; 2Beijing Institute of Auto-Testing Technology, Beijing, 100088, China) |
| Abstract: | Based on the difficulty faced in on-line testing of analog integrated circuit, a new measurement has been proposed with BIST structure, which can be used for analog circuit testing. This method can be easily implemented in circuit and be embedded in the tested circuit. |
| Keywords: | Analog Integrated Circuit BIST ARMA module |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |