Direct Determination of Trace Impurities in Silicon Nitride by Fluorinating ETV-ICP-AES with the Slurry Sampling Technique |
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| Authors: | PENG Tian-You JIANG Zu-Cheng HU Bin LIAO Zheng-Huan |
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| Institution: | Department of Chemistry, Wuhan University, Wuhan 430072, P. R. China |
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| Abstract: | Silicon nitride (Si3N4) ceramics are of great technological importance as high-density. corrosion-and heat-resistant materials for use in high-temperature and in reactor technology. |
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