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Calculations of field ionization in the field ion microscope |
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| Affiliation: | 1. Instituto de Microscopía Electrónica y Materiales, Departamento de Ciencia de los Materiales e I.M. y Q.I., Facultad de Ciencias, Universidad de Cádiz, Campus Río San Pedro, s/n, Puerto Real, Cádiz 11510, Spain;2. School of Engineering, University of Glasgow, Glasgow G12 8QQ, UK;3. GPM, Université et INSA de ROUEN, UMR CNRS 6634, BP 12, Avenue de l''université, Saint Etienne du Rouvray 76801, France |
| Abstract: | The ionization of a gas atom as it occurs in the field ion microscope is discussed. A wide range of values for the electric field intensity at the metal surface are considered in calculating the ionization occurring both far away from and close to the tip. Ionization distribution curves are calculated and electric fields strengths are determined at points where the distributions peak. Calculations of ionization zone widths and best image conditions are made and a new interpretation of best image conditions is considered. A new field calibration method is suggested. |
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