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垒温对硅衬底GaN基蓝光LED发光效率的影响
引用本文:高江东,刘军林,徐龙权,王光绪,丁杰,陶喜霞,张建立,潘拴,吴小明.垒温对硅衬底GaN基蓝光LED发光效率的影响[J].发光学报,2016,37(2):202-207.
作者姓名:高江东  刘军林  徐龙权  王光绪  丁杰  陶喜霞  张建立  潘拴  吴小明
作者单位:南昌大学 国家硅基LED工程技术研究中心, 江西 南昌 330047
基金项目:国家自然科学基金重点项目(61334001),863计划(2011AA03A101)
摘    要:用MOCVD技术在硅衬底上生长了GaN基蓝光LED外延材料,研究了有源层多量子阱中垒的生长温度对发光效率的影响,获得了不同电流密度下外量子效率(EQE)随垒温的变化关系。结果表明,在860~915℃范围内,发光效率随着垒温的上升而上升。当垒温超过915℃后,发光效率大幅下降。这一EL特性与X光双晶衍射和二次离子质谱所获得的阱垒界面陡峭程度有明显的对应关系,界面越陡峭则发光效率越高。垒温过高使界面变差的原因归结为阱垒界面的原子扩散。垒温偏低使界面变差的原因归结为垒对前一个量子阱界面的修复作用和为后一个量子阱提供台阶流界面的能力偏弱。外延生长时的最佳垒温范围为895~915℃。

关 键 词:LED  硅衬底  GaN  垒温  外量子效率
收稿时间:2015-10-02

Dependence of Electroluminescence on Barriers Temperature in GaN Base Blue LED on Silicon Substrate
GAO Jiang-dong,LIU Jun-lin,XU Long-quan,WANG Guang-xu,DING Jie,TAO Xi-xia,ZHANG Jian-li,PAN Shuan,WU Xiao-ming,MO Chun-lan,WANG Xiao-lan,QUAN Zhi-jue,ZHENG Chang-da,FANG Fang,JIANG Feng-yi.Dependence of Electroluminescence on Barriers Temperature in GaN Base Blue LED on Silicon Substrate[J].Chinese Journal of Luminescence,2016,37(2):202-207.
Authors:GAO Jiang-dong  LIU Jun-lin  XU Long-quan  WANG Guang-xu  DING Jie  TAO Xi-xia  ZHANG Jian-li  PAN Shuan  WU Xiao-ming  MO Chun-lan  WANG Xiao-lan  QUAN Zhi-jue  ZHENG Chang-da  FANG Fang  JIANG Feng-yi
Institution:National Institute of LED on Silicon Substrate, Nanchang University, Nanchang 330047, China
Abstract:The growth of GaN-based blue LED with different barriers temperature in multiple quantum wells on silicon substrate by MOCVD method was reported. The dependence of luminescence on barriers temperature was obtained. The relationship between external quantum efficiency (EQE) and barriers temperature under different current density showed that EQE increases with barriers temperature during the temperature from 860 to 915 ℃, and then EQE decreases a lot after the temperature over 915 ℃. The results of XRD, SIMS and EL support each other very obviously, which means that the luminescence efficiency is contributed on the sharpness of well-barrier interface. Over top temperature of barriers will result in a worse sharpness of well-barrier interface owing to an undesirable atoms diffusion. Much lower temperature of barriers will also cause a worse sharpness of well-barrier due to the non-step flow growth of barriers. The optimization barriers temperature range is from 895 to 915℃ for epitaxy growth.
Keywords:LED  Si substrate  GaN  barrier temperature  EQE
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