Near-field scanning microwave microscope application on Cu-phthalocyaninethin-film organic field-effect transistor

By the standard vacuum evaporation technique Cu(II)-phthalocyanine (Cu-Pc) thin films have been fabricated. For the samples, prepared at room temperature and post-annealed from 100°C to 350°C temperatures, optical spectra in the visible and near IR ranges have been measured. By using nondestructive near-field scanning microwave microscopy organic field-effect transistor (OFET) based on Cuphthalocyanine thin films have been investigated. The changes of crystal structure of Cuphthalocyanine thin film from the α- to the β-phase were controlled by the temperature of annealing. The values of holes’ mobility and the electroconductivity of Cu-phthalocyanine thin films have been obtained depending on the annealing temperature.