Integrated-optic variable delay line and its application to a low-coherence reflectometer |
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Authors: | Takiguchi K Itoh M Takahashi H |
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Institution: | NTT Photonics Laboratories, NTT Corporation, Atsugi, Kanagawa, Japan. taki@aecl.ntt.co.jp |
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Abstract: | We propose a large-scale variable delay line based on planar light-wave circuit technology and its application as a reference arm in an optical low-coherence reflectometer. This variable delay line is composed of 16 asymmetrical delay arm pairs sandwiched between 2 optical switches, which select the path for a needed delay. This configuration enables us to eliminate the need for a moving part in the reflectometer. We can scan the reference arm over a length of 262.1 mm with a step of less than 1.0 microm in air and achieve reflectometer sensitivity of about -47 dB. |
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