Diffusion of selenium and tellurium in silicon |
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Authors: | H Stümpel M Vorderwülbecke J Mimkes |
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Institution: | (1) Fachbereich Physik, Universität, D-4790 Paderborn, Fed. Rep. Germany |
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Abstract: | Diffusion of selenium and tellurium in silicon has been investigated in the temperature range 1000°C to 1310°C by sheet conductivity. For Si SeD
0= 0.3±0.1 cm2/s andh=2.6±0.1 eV, and for Si TeD
0=0.9±0.3 cm2/s and h=3.3±0.1eV have been obtained. The surface concentrations for both dopants were of the order of 5 × 1013 to 6×1016cm–3. The Hall coefficient leads to an energy level of 300±15meV for selenium and 200±20meV for tellurium. |
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Keywords: | 66 30 |
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