Enhanced sensitivity of Z-scan technique by use of flat-topped beam |
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Authors: | J Wang B Gu Y M Xu and H T Wang |
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Institution: | (1) Nanjing National Laboratory of Microstructures and Department of Physics, Nanjing University, Nanjing, 210093, China;(2) Jiangsu Key Laboratory on Opto-Electronic Technology and Department of Physics, Nanjing Normal University, Nanjing, 210097, China |
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Abstract: | Based on the Huygens–Fresnel diffraction integral method, we report a theoretical investigation on the closed-aperture Z-scan
technique by using the flat-topped beam. The sensitivity of the flat-topped beam Z-scan technique, which can be enhanced with
the increase of the flatness order N for the flat-topped beam, is greatly higher than of the Gaussian beam. Some salient characteristics of the flat-topped beam
Z-scan traces are addressed. The flat-topped beam Z-scan technique for characterizing the instantaneous nonlinearity is also
presented. |
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Keywords: | PACS" target="_blank">PACS 42 65 An 42 25 Bs 42 70 Jk |
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