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High pressure x-ray diffraction measurements on Mg2SiO4 glass
Authors:C.J. Benmore  E. Soignard  S.A. Amin  K. McKiernan  M.C. Wilding
Affiliation:
  • a X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, IL 60439, USA
  • b Department of Physics, Arizona State University, Tempe, AZ 85287-1504, USA
  • c Department of Chemistry & Biochemistry, Arizona State University, Tempe, AZ 85287-1604, USA
  • d Materials Development, Inc, Arlington Heights, IL 60004, USA
  • e Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth, SY23 3BZ, UK
  • Abstract:The structure factors of Mg2SiO4 glass have been measured using high energy x-ray diffraction up to pressures of 30.2 GPa, and the equation of state measured up to 12.8 GPa. The average Mg-O coordination numbers were extracted from the experimental pair distribution functions assuming two cases (i) there is no change in Si-O coordination number with pressure and (ii) the average Si-O coordination number increases the same as for pure SiO2 glass. Both analyses give similar results and show a gradual increase in the average Mg-O coordination number from 5.0 at ambient pressure to ~ 6.6(6) at 30.2 GPa. There is good qualitative agreement between the experimental structure and equation of state data for the glass compared to several recent molecular dynamics simulations carried out on liquid Mg2SiO4.
    Keywords:High pressure   Silicate glass   Glass structure   X-ray diffraction   Equation of state
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