Spirally polarized beams for polarimetry measurements of deterministic and homogeneous samples |
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| Institution: | 1. Departamento de Teoría de la Señal y Comunicaciones, Universidad Politécnica de Madrid, Campus Sur, Madrid, 28031, Spain;2. Dipartimento di Ingegneria, Universitá Roma Tre, Rome, Italy;3. Departamento de Óptica, Universidad Complutense de Madrid, Madrid 28040, Spain;1. KU Leuven, Department of Materials Engineering, Technology Campus Diepenbeek, Wetenschapspark 27, B-3590, Diepenbeek, Belgium;2. KU Leuven, Department of Materials Engineering, Technology Campus De Nayer Sint-Katelijne-Waver, Jan de Nayerlaan 5, B-2860, Sint-Katelijne-Waver, Belgium;1. School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, Fujian, PR China;2. College of Computer Science and Technology, Zhejiang University of Technology, Hangzhou, Zhejiang, PR China;3. Department of Mechanical and Manufacturing Engineering, University of Calgary, Calgary, Alberta, Canada;1. School of Science, Tianjin Chengjian University, Tianjin 300384, China;2. Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, TEDA Applied Physics Institute & School of Physics, Nankai University, Tianjin 300457, China;3. School of Control and Mechanical Engineering, Tianjin Chengjian University, Tianjin 300384, China;1. Laboratoire Navier, UMR 8205, École des Ponts, IFSTTAR, CNRS, Université Paris-Est, Champs-sur-Marne, France;2. Institut P’, UPR 3346 CNRS, Université de Poitiers, SP2MI, Futuroscope Chasseneuil, France;3. CIMAP, UMR 6252, CNRS, CEA, Université de Caen Basse-Normandie, ENSICAEN, Caen, France;4. Université de Toulouse; Mines Albi, INSA, UPS, ISAE; ICA (Institut Clément Ader), Campus Jarlard, F-81013 Albi Cedex 09, France;5. Institut Pascal, UMR6602, CNRS, Université Blaise Pascal – IFMA, Aubière, France;6. Laboratoire de Mécanique et Génie Civil, UMR CNRS 5508, Université Montpellier 2, Montpellier, France |
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| Abstract: | The use of spirally polarized beams (SPBs) in polarimetric measurements of homogeneous and deterministic samples is proposed. Since across any transverse plane such beams present all possible linearly polarized states at once, the complete Mueller matrix of deterministic samples can be recovered with a reduced number of measurements and small errors. Furthermore, SPBs present the same polarization pattern across any transverse plane during propagation, and the same happens for the field propagated after the sample, so that both the sample plane and the plane where the polarization of the field is measured can be chosen at will. Experimental results are presented for the particular case of an azimuthally polarized beam and samples consisting of rotated retardation plates and linear polarizers. |
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| Keywords: | Polarimetry Polarization |
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