Background and amplitude encoded fringe patterns for 3D surface-shape measurement |
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| Affiliation: | 1. Instituto de Física y Matemáticas, Universidad Tecnológica de la Mixteca, Km 2.5 Carretera a Acatlima, Huajuapan de León, Oaxaca 69000, México;2. Facultad de Ciencias Físico-Matemáticas, Benemérita Universidad Autónoma de Puebla, Apdo. Postal 1152 Ciudad Universitaria, Puebla 72000, México;3. Universidad Tecnológica de Puebla, Mecatrónica, Antiguo Camino a la Resurrección 1002-A, 72300 Puebla, México;1. College of Optoelectronic Engineering, Key Laboratory of Optoelectronics Devices and Systems, Education Ministry of China, Shenzhen University, Shenzhen 518060, China;2. Shandong Provincial Key Laboratory of Laser Technology and Application, Department of Optics, School of Information Science and Engineering, Shandong University, Jinan 250100, China;3. School of Mechanical Engineering, Hebei University of Technology, Tianjin 300130, China;1. Departamento de Electrónica, Universidad de Guadalajara, Av. Revolución 1500, C.P. 44840 Guadalajara, Jalisco, México;2. Departamento de Ingenierías, Universidad de Guadalajara, Av. Independencia Nacional 151, C.P. 48900 Autlán, Jalisco, México;3. Instituto de Física, Facultad de Ingeniería, UdelaR, J. Herrera y Reissig 565, Montevideo, Uruguay;1. Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China;2. Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education of China. Beijing Institute of Technology, Beijing 100081, China |
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| Abstract: | This paper presents a new fringe projection method for surface-shape measurement that uses background and amplitude encoded high-frequency fringe patterns. The background and amplitude, combined as a codeword, identify the wrapped phase fringe order to partially unwrap the phase to a low frequency. The low-frequency wrapped phase map is then directly used to reconstruct the surface based on geometry constraints without requiring additional images as in other temporal phase-unwrapping methods. Measurements performed on a double-hemisphere, mask, and manikin head, using projected fringe patterns with 48 periods, demonstrated the ability of the method to perform 3D shape measurement with only four projected patterns and captured images, using a single camera and projector. |
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| Keywords: | Surface-shape measurement Fringe projection Coded fringe pattern Geometry constraints Optical metrology |
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