General electrical transport properties of polycrystalline multi-layered metallic thin films |
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Authors: | Chu-Xing Chen |
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Institution: | (1) Department of Physics, University of Arizona, 85721 Tucson, AZ, USA |
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Abstract: | We have derived, following the recent theoretical calculation of the electrical conductivity of multi-layered metallic thin films, a general solution of the electrical conductivity for those films with grain structures, since those structures give important contributions to the electrical transport properties of polycrystalline thin film. The temperature coefficients of resistivity have also been obtained. |
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Keywords: | 73 40 Jn 73 60 Dt |
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