Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope |
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Authors: | Hiroshi Ishiwata Hiroki Nagai Toshihisa Naka Masahide Itoh |
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Institution: | 1. Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki, 308-8573, Japan
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Abstract: | To realize high-precision and wide-field measurements in retardation-modulated differential interference contrast (RM-DIC)
microscope, we developed a new technique to stitch plural images taken by a high-magnification objective lens with attention
paid to the high edge detection ability of the RM-DIC microscope. We showed some experimental results with grating samples
and made sure that the developed new method had good performance for widening the measurement field of the RM-DIC microscope. |
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