Relative intensities in X-ray photoelectron spectra.: Part VIII |
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Authors: | V.G. Yarzhemsky V.I. Nefedov M.Ya. Amusia N.A. Cherepkov L.V. Chernysheva |
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Affiliation: | Institute of General and Inorganic Chemistry, Academy of Sciences of the U.S.S.R., Moscow U.S.S.R.;A.F. Ioffe Physical and Technical Institute, Academy of Sciences of the U.S.S.R. Leningrad U.S.S.R. |
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Abstract: | The photoionization cross-sections for the 3s and 3p shells of atomic Si, P, S, and Cl and the S2+ ion, and for the 2s and 2p shells of atomic F have been calculated using the random-phase approximation with exchange (RPAE) for the average-configuration term. Using the theoretical atomic cross-section values, the partial cross-sections for photoionization of the SF6 molecule have been calculated for hv ? 54 eV and the photoelectron spectra have been interpreted. The calculation of relative intensities in the photoelectron spectra of H2S is presented. The influence of the effective charge of an atom on the photoionization cross-section value for a molecular level is shown. |
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