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水热法制纳米CeO2膜及紫外吸收性能研究
引用本文:周丽,刘连利,孙彤. 水热法制纳米CeO2膜及紫外吸收性能研究[J]. 化学研究与应用, 2012, 0(2): 237-241
作者姓名:周丽  刘连利  孙彤
作者单位:渤海大学科技实验中心辽宁省硅材料工程技术研究中心
基金项目:辽宁省科技厅工程中心基金项目(2009402007)资助
摘    要:以Ce(NO3)3.6H2O和CO(NH2)2为原料,采用水热法在玻璃基质上制备了CeO2纳米膜。研究了水热温度和时间对所制备纳米CeO2薄膜的抗紫外性能的影响。采用XRD、FT-IR、SEM、UV-Vis以及自动椭圆偏振仪等测试手段对CeO2纳米膜及粉体进行了表征。结果表明,水热法制备的薄膜,最佳的水热工艺条件为水热温度130℃加热7 h。在此条件下,制备的薄膜厚度达100nm,晶型较好,膜表面平整度较高,且具有优异的可见光透过性和紫外吸收特性。

关 键 词:水热法  纳米CeO2    抗紫外性能

Preparation of nanometer CeO2 film by hydrothermal method and its UV-absorption performance researches
ZHOU Li,LIU Lian-li,SUN Tong. Preparation of nanometer CeO2 film by hydrothermal method and its UV-absorption performance researches[J]. Chemical Research and Application, 2012, 0(2): 237-241
Authors:ZHOU Li  LIU Lian-li  SUN Tong
Affiliation:(Bohai University Center for Science&Technology Experiment,Liaoning Province Silicon Materials Engineering Technology Research Centre,jinzhou 121000,China)
Abstract:Nanometer CeO2 films were prepared on the glass substrate by hydrothermal method using Ce(NO3)3·6H2O and CO(NH2)2 as raw materials.The effects of hydrothermal temperature and reaction time on CeO2 films were researched,and the UV absorption of the films was also studied.XRD、FT-IR、SEM、UV-Vis and ellipsometer were used to characterize the nanometer CeO2 films and powders.The results show that the optimum hydrothermal technological condition is 130 ℃ 7 h.Under the optimum condition,the thickness of the films with well-developed crystalline is thinner than 100 nm.The surface of films is quite flat and with excellent visible light transmission and ultraviolet absorption characteristics.
Keywords:hydrothermal method  nanometer CeO2  film  anti-UV capability
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