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采用扫描电镜的ECP技术分析人工合成金刚石晶体中的晶体缺陷
引用本文:朱衍勇,廖乾初.采用扫描电镜的ECP技术分析人工合成金刚石晶体中的晶体缺陷[J].电子显微学报,1995,14(5):369-372.
作者姓名:朱衍勇  廖乾初
作者单位:北京冶金工业部钢铁研究总院
摘    要:本文应用扫描电镜的ECP技术对人造金刚石晶体表面的位错密度,进行了实验分析,并同位错蚀坑分析技术的测量结果进行了比较,结果表明,如采用临界束流强度作为描述ECP本征衬度的参数,则它同位错密度间存在明显定量的数学关系,因此上述临界束流强度可用来评价晶体中位错密度的相对变化。

关 键 词:金刚石  ECP技术  蚀坑技术  人造金刚石  晶体缺陷

Evalution of the Crystal Defects in Synthetic Diamond by ECP Technique of SEM
Zhu Yanyong Liao Qianchu.Evalution of the Crystal Defects in Synthetic Diamond by ECP Technique of SEM[J].Journal of Chinese Electron Microscopy Society,1995,14(5):369-372.
Authors:Zhu Yanyong Liao Qianchu
Abstract:By comparing with the results obtained from etch pits technique,the measurements of the dislocation densi-ty of the diamond crystal have been made by ECP technique of SEM.With the aid of the parameter such as the critical current intensity to reveal the ECP intrinsic contrast of thecrystal defect, the experimental results indicate that the relationship between the critical current intensity andthe dislocation density can be quantitatively expressed with an empirical equation. Owing to the above reson,itis concluded that the crittcal current intensity suits to evaluate the variance of the crystal defects.
Keywords:ECP technique Etch pit technique Dislocation density Synthetic diamond Intrinsic contrast  
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