|
|||||
|
|
The influence of X-ray resonant Raman scattering effects on the detection of copper(II) tetrasulphonated phthalocyanine (CuTSPc) thin-films deposited on gold electrodes |
|
| Authors: | Karl Peeters Karolien De Wael Annemie Adriaens Gerald Falkenberg Laszlo Vincze |
| Institution: | 1. Ghent University, Department of Analytical Chemistry, Krijgslaan 281 S12, B-9000 Ghent, Belgium;2. Hamburger Synchrotronstrahlungslabor at Deutsches Elektronen-Synchrotron, DESY, D-22607 Hamburg, Germany |
| Abstract: | The influence of X-ray resonant Raman scattering on the detection capabilities of copper(II) tetrasulphonated phthalocyanine (CuTSPc) thin-films on gold electrodes has been investigated by means of synchrotron radiation X-ray fluorescence. In particular the paper focuses on the influence of the excitation energy in the relative narrow energy region of 9.2 to 11.7 keV on the detection limits and the peak-to-background ratios of copper. |
| Keywords: | X-ray resonant Raman scattering (XRRS) Detection limit Copper(II) tetrasulphonated phthalocyanine (CuTSPc) Gold electrode Synchrotron radiation X-ray fluorescence (XRF) |
| 本文献已被 ScienceDirect 等数据库收录！ | |