Trace element determination in thorium oxide using total reflection X-ray fluorescence spectrometry

Applicability of Total Reflection X-ray Fluorescence (TXRF) spectrometry for the determination of trace metals at concentration of µg/g level in thorium oxide was studied. The TXRF spectrometer was calibrated using a multielement standard solution and the method was validated by analyzing another multielement standard solution. Sample preparation conditions were optimized for the TXRF determinations of trace metals in thorium oxide. The elements K, Ca, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Sr, Y, Ba and Pb present in thorium oxide standards were determined after dissolving them in HNO₃/HF mixture and separating the bulk matrix, thorium, by solvent extraction using tri-n-butyl phosphate (TBP) and tri-n-octyl phosphine oxide (TOPO) as extractants. A comparison of TXRF determined concentrations of trace elements Ca, V, Cr, Mn, Fe, Ni and Cu with the certified values shows that TXRF determined concentrations have an RSD of 20% (1 s for n = 4) and are within an agreement of 20% of the certified values in most of the cases.