| 日盲紫外焦平面探测器的抗辐射加固设计 |
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| 引用本文： | 申志辉,罗木昌,叶嗣荣,樊鹏,周勋. 日盲紫外焦平面探测器的抗辐射加固设计[J]. 半导体光电, 2019, 40(2): 157-160, 165 |
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| 作者姓名： | 申志辉 罗木昌 叶嗣荣 樊鹏 周勋 |
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| 作者单位： | 重庆光电技术研究所, 重庆 400060,重庆光电技术研究所, 重庆 400060,重庆光电技术研究所, 重庆 400060,重庆光电技术研究所, 重庆 400060,重庆光电技术研究所, 重庆 400060 |
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| 基金项目： | 国防基础科研计划项目(JCKY2017210A003)；国家安全重大基础研究项目(61328403). |
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| 摘 要： | 设计了一款320×256元抗辐射日盲紫外焦平面阵列探测器,重点针对探测器的读出电路版图、积分开关偏置点、探测器芯片外延结构及器件工艺开展了抗辐射加固设计。对加固样品开展了γ总剂量和中子辐照试验和测试,试验结果表明样品的抗电离辐照总剂量达到150krad(Si),抗中子辐照注量达到1×1013n/cm2(等效1MeV中子),验证了抗辐射加固措施的有效性。
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| 关 键 词： | 紫外焦平面探测器 读出电路 抗辐射加固 总剂量效应 |
| 收稿时间： | 2018-12-17 |
Radiation-Hardened Design of Solar-Blind Ultraviolet Focal Plane Arrays |
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| SHEN Zhihui,LUO Muchang,YE Sirong,FAN Peng and ZHOU Xun. Radiation-Hardened Design of Solar-Blind Ultraviolet Focal Plane Arrays[J]. Semiconductor Optoelectronics, 2019, 40(2): 157-160, 165 |
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| Authors: | SHEN Zhihui LUO Muchang YE Sirong FAN Peng ZHOU Xun |
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| Affiliation: | Chongqing Optoelectronics Research Institute, Chongqing 400060, CHN,Chongqing Optoelectronics Research Institute, Chongqing 400060, CHN,Chongqing Optoelectronics Research Institute, Chongqing 400060, CHN,Chongqing Optoelectronics Research Institute, Chongqing 400060, CHN and Chongqing Optoelectronics Research Institute, Chongqing 400060, CHN |
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| Abstract: | A type of 320×256 radiation-hardened solar-blind ultraviolet focal plane arrays was designed, and the work was mainly focused on the design of read out integrated circuit (ROIC), offset points of the integral switch, eptiaxy structure and process of the chips. Gamma and neutron irradiation tests were performed on the samples, and the results show that the designed FPA samples can realize radiation hardening with a total ionizing dose of 150krad (Si) and neutron exposure of 1×1013n/cm2, thus the effectiveness of radiation hardened design is verified. |
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| Keywords: | UV-FPA readout circuit radiation hardening TID effects |
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