首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Inverse scattering for high-resolution interferometric microscopy
Authors:Ralston Tyler S  Marks Daniel L  Boppart Stephen A  Carney P Scott
Institution:Beckman Institute for Advanced Science and Technology, Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA. tralston@engineering.uiuc.edu
Abstract:We extend the applicability of inverse scattering for optical coherence tomography (OCT) to the case of high numerical aperture focusing optics. We include the effects of tight focusing so that the approach is applicable to any interferometric microscopy method. The applicability to modalities, such as OCT and optical coherence microscopy, enables computed reconstruction of three-dimensional volumes from en face temporal ranging data. Simulations show that the computed structure outside of the focal plane exhibits spatially invariant resolution on par with the resolution achieved at the focal plane.
Keywords:
本文献已被 PubMed 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号