Production of projectile and targetK X-rays by single and multiple electron-capture in collisions of Si14+ and Si13+ ions with argon atoms at 4.5 and 5.5 MeV/amu |
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Authors: | S Andriamonje J F Chemin J Roturier B Saboya J N Scheurer R Gayet A Salin H Laurent P Aguer J P Thibaud |
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Institution: | 1. Centre d'Etudes Nucléaires de Bordeaux-Gradignan, Université de Bordeaux I, Gradignan, France 2. Laboratoire des Collisions Atomiques, Université de Bordeaux I, Talence, France 3. Institut de Physique Nucléaire, Orsay, France 4. Centre de Spectroscopie Nucléaire et de Spectroscopie de Masse, Orsay, France
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Abstract: | Projectile and target X-ray cross-sections have been measured in collisions of bare and hydrogenlike Silicon ions with argon atoms. Projectile energies are 125 MeV and 153 MeV, i.e. the intermediate velocity region forK-shell capture. Coincidence measurements between X-ray photons and the scattered Si n+ projectiles with charge statesn-1,n-2 andn-3 have been made. The relative contribution of charge exchange and direct ionization (or excitation) of the targetK-shell has been obtained directly by this new method. DoubleK-shell electron transfer is demonstrated to be very large in the case of fully stripped Si ions. A thorough theoretical analysis of the data is carried out and multiple capture processes are evaluated using an independent electron model. |
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