| 拉曼散射研究微尺寸圆锥形状的GeSi合金薄膜的应力(英文) |
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| 引用本文： | C.M. Lin C.T. Chia V. I. Mashanov H.H. Cheng. 拉曼散射研究微尺寸圆锥形状的GeSi合金薄膜的应力(英文)[J]. 光散射学报, 2005, 17(3): 283-284 |
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| 作者姓名： | C.M. Lin C.T. Chia V. I. Mashanov H.H. Cheng |
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| 作者单位： | Department of Physics，National Taiwan Normal University，Taipei 116 Taiwan，Center for Condensed Matter Sciences，National Taiwan University，Taipei 106，Taiwan，Center for Condensed Matter Sciences，National Taiwan University，Taipei 106，Taiwan |
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| 基金项目： | Financial support from the National Science Council R. 0.C. under Contract No. 92 - 2112 - M - 003 - 017 and 92 - 2112 - M - 134 - 001 is highly acknowledged. |
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| 摘 要： | pacc:7830,7850C Wepresentthemicro-Ramanstudyof curvedGexSi1-x/GeySi1-yheterostructure,and foundthestrainofthecurvedthinlayerispropor tionaltothecurvature,i.e.inverselyproportional tothediameter.TheopticalandelectricpropertiesofSi1-x GexalloygrownonSisubst…
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| 关 键 词： | 拉曼散射 微尺寸圆锥形状 GeSi合金薄膜 异质结构 |
| 文章编号： | 1004-5929（2005）03-0283-02 |
Strain of the Micro-sized Cone-shape GeSi Alloy Film Determined by Raman Scattering |
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| C.M. Lin,C.T. Chia,V. I. Mashanov,H.H. Cheng. Strain of the Micro-sized Cone-shape GeSi Alloy Film Determined by Raman Scattering[J]. Chinese Journal of Light Scattering, 2005, 17(3): 283-284 |
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| Authors: | C.M. Lin C.T. Chia V. I. Mashanov H.H. Cheng |
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| Abstract: | We present the micro-Raman study of curved GexSi1-x/GeySi1-y heterostructure, and found the strain of the curved thin layer is proportional to the curvature, I.e. Inversely proportional to the diameter.…… |
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