首页 | 本学科首页   官方微博 | 高级检索  
     


Deformation measurement using high resolution Moiré photography
Authors:C. Forno
Affiliation:

National Physical Laboratory, Teddington, Middlesex TW11 OLW, UK

Abstract:By installing a slotted mask inside the lens of a 35 mm camera the response can be tuned to resolve 300 lines/mm. The camera is used to record changes in fine grid patterns applied to engineering structures and by analysing the processed negatives in a spatial filtering system, moiré fringe maps are generated representing in detail the separate x and y displacements that have occured. Measurements have been obtained from materials ranging from concrete to soft plastics and a variety of patterns is described for treating most surfaces.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号