首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Depth profiling the thermal reflection coefficient of an opaque solid via an inverse thermal wave scattering theory based on the Method of Images
Authors:J Karanicolas  SW Fu  JF Power
Institution:(1) Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Qc, H3A 2K6, Canada (Fax: +5-14/398-3797, E-mail: power@chemistry.mcgill.ca), CA
Abstract:A new formulation of the inverse problem of depth profiling the thermal properties of an opaque solid based on one-dimensional photo-generated thermal waves is presented. The inverse problem as posed is linear in a set of lumped thermal reflection coefficients which account for the return of energy to the surface by all significant heat conduction channels. An analysis based on the Method of Images relates these coefficients to individual values of the interface thermal reflection coefficients in the material. No weak backscattering assumption is invoked to linearize the problem. The method yields a unique solution subject to a given condition of regularization. Solutions recovered by the method are stable at experimentally feasible error levels. Received: 27 September 1999 / Published online: 16 June 2000
Keywords:PACS: 44  05  +e  44  10  +i  44  15  +a
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号