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Leonard C. Feldman,James W. Mayer. Fundamentals of surface and thin film analysis. North-Holland,New York–Amsterdam–London, 1986, 352 Seiten, 175 Abb., 9 Tabellen im Anhang,ca. 150 Literaturzitate. ISBN 0-444-00989-2. US $ 47.50/Dfl. 125.00. In the USA/Canada the book is available from Elsevier Sc. Publ. New York,N.Y. 10017 |
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| Authors: | A. Meisel |
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