Review of near-field optical microscopy |
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| Authors: | Wu Shi-fa |
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| Affiliation: | (1) Institute of Near-field Optics and Nanotechnology, Department of Physics, Dalian University of Technology, Dalian, 116023, China |
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| Abstract: | This review has introduced a new near-field optical microscope (NOM)—atomic force microscope combined with photon scanning tunneling microscope (AF / PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM. |
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| Keywords: | near-field optical microscope (NOM) atomic force microscope combined with photon scanning tunneling optical microscope (AF/PSTM) SNOM |
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