|
|||||
|
|
XPS study of vanadium–yttrium hydrates |
|
| Authors: | V Bondarenka S Grebinskij S Kaciulis G Mattogno S Mickevicius H Tvardauskas V Volkov and G Zakharova |
| Institution: | a Semiconductor Physics Institute, A.Gostauto 11, LT-2600 Vilnius, Lithuania b Institute of Material Chemistry, CNR, P.O. Box 10, I-00016 Monterotondo Scalo, Italy c Institute of Solid State Chemistry, Pervomaiskaia 91, RUS-620219, Yekaterinburg, Russia |
| Abstract: | X-ray photoelectron spectroscopy was used to study the chemical composition and valence states of the metal ions in vanadium–yttrium hydrate. The binding energies, FWHM and shape of the main XPS peaks were analyzed. The concentration ratio of tetra- and pentavalent vanadium ions C=V4+/(V4++V5+), which is an important parameter, deciding the electronic part of total conductivity, was determined before (C=0.14) and after heating at 720 K (C=0.28). |
| Keywords: | Xerogel XPS Vanadium–Yttrium hydrate |
| 本文献已被 ScienceDirect 等数据库收录！ | |