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离子束辅助反应制备的氧化铪薄膜特性
引用本文:王聪娟,晋云霞,邵建达,范正修.离子束辅助反应制备的氧化铪薄膜特性[J].强激光与粒子束,2007,19(12):2087-2090.
作者姓名:王聪娟  晋云霞  邵建达  范正修
作者单位:中国科学院 上海光学精密机械研究所 光学薄膜技术研究发展中心, 上海 201800
摘    要: 采用电子束直接蒸发氧化铪、无辅助电子束反应蒸发和离子束辅助反应蒸发金属铪3种沉积方式制备了单层HfO2薄膜,对样品的光学性能、结构特性以及激光损伤特性进行了研究。实验结果表明:通过反应沉积的方法可以有效减少缺陷产生并改善均匀性,施加离子辅助可以提高薄膜的折射率,在一定条件下还可以有效地降低吸收,但激光损伤阈值仍未达到直接采用氧化铪制备的水平;晶体结构方面,离子辅助条件下可以获得单斜相氧化铪薄膜,并且随着轰击能量的提高由(002)面的择优取向向(-111)面转变。

关 键 词:薄膜  氧化铪  离子束辅助  反应沉积
文章编号:1001-4322(2007)12-2087-04
收稿时间:2007-05-24
修稿时间:2007-09-27

Characters of hafnium oxide deposited by reactive ion-assisted deposition
WANG Cong-juan,JIN Yun-xia,SHAO Jian-da,FAN Zheng-xiu.Characters of hafnium oxide deposited by reactive ion-assisted deposition[J].High Power Laser and Particle Beams,2007,19(12):2087-2090.
Authors:WANG Cong-juan  JIN Yun-xia  SHAO Jian-da  FAN Zheng-xiu
Institution:Research and Development Center for Thin Optical Films Coating,Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, P.O.Box 800-211, Shanghai 201800, China
Abstract:HfO2 films have been deposited by electron beam evaporation of hafnium oxide,reactive evaporation without ion beam assistance and reactive ion beam assisted deposition(RIBAD).Optical and structural properties and laser-induced damage threshold(LIDT) of the films have been studied.It is found that HfO2 film deposited with reactive deposition has less defects and good uniformity.The sample deposited by RIBAD has higher refraction index,and can reduce absorption at a certain condition,but it LIDT is under improvement.The crystal structure of the sample deposited with RIBAD is monoclinic,and when the bombardment energy rises,the preferred orientation changes from(002) to(-111).
Keywords:Thin film  Hafnium oxide  Ion-assisted deposition  Reactive deposition
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