| Abstract: | During preparation of very thin polymer belnd films from a solution of polymers, the phase‐separated structures which are quite different from that observed for the bulk blend film was observed. From atomic force microscopic(AFM) observation, it is concluded that the surface undulation, which reflects the phase separated morphology of the blend system, is present. In the case of (polystyrene(PS)/poly(methyl methacrylate)(PMMA)) blend system, a large influence of end‐group chemistry on the surface morphology was observed. The phase identification of the (rubbery polymer/glassy polymer) binary blend thin films was successfully achieved by scanning vioscoelasticity microsopy(SVM). |
