CMOS集成电路瞬态电流片外电流传感器电路

瞬态电流(IDDT)测试经常被看作是静态电流(IDDQ)测试的替代或补充,特别在深亚微米技术中,受到越来越多的关注。根据一种基于电荷的瞬态电流片外电流传感器电路,并在其基础上进行改进并对两阶多米诺加法器电路进行仿真实验,实验结果表明,改进后的电路能有效读取集成电路中的瞬态电流,从而实现瞬态电流的测试。

Off - chip Transient Current Monitor Circuit of CMOS Integrated Circuit

Transient current testing(IDDT) has been often cited as an alternative or supplement to IDDQ testing,especially in deep-submicro technologies,such test technique is noticed by more and more researchers.An off-chip and charge-based transient current monitor circuit is presented.On the basis of it,the circuits is improved and simulated for second Domino parallel circuits,experimental results show that the circuit can effectively sense transient current of integrated circuit and hence,perform transient current testing.