A microscope system based on bevel-axial method auto-focus |
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Authors: | Ho-Chung Chang Ta-Ming Shih Nian Zu Chen Nen-Wen Pu |
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Affiliation: | 1. Graduate School of Defense Science, National Defense University, Taiwan;2. Department of Weapon System Engineering, National Defense University, Taiwan;3. Instrument Technology Research Center, Taiwan;4. Department of Applied Physics, National Defense University, Taiwan |
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Abstract: | A microscope system based on bevel-axial method auto-focus (BAM-AFS) is proposed. The purpose is to establish an auto-focus microscope system that calculates the focus position one or many times. In this paper, we propose a bevel-axial method that had an included angle between CCD sensor and image plane with multi-parameters fusing from image to obtain the in-focus position directly in the first phase and combined Kalman estimate to obtain the in-focus position for different objects in the second phase. We discuss the relation between focus positions and image focus at the end. |
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