Effect of annealing on photo accelerated chemically deposited Indium sulfide thin films with various cationic precursors

The present work reports the deposition of Indium sulfide thin films by a recently established novel method called photo-assisted chemical deposition technique. It is a very low cost method for the deposition of thin films, and can be easily scaled up for industrial production. Indium sulfide thin films are deposited on glass substrates through various cationic precursors and the effect of annealing on structural, optical and morphological properties was investigated. Films have been characterized with respect to their structural, optical and morphological properties by means of X-ray diffraction, UV–VIS-NIR Spectrophotometer, SEM and AFM techniques. As-deposited films on glass substrates were amorphous and became crystalline after annealing. The grain size of all the annealed films are larger than the as-prepared films and attained a maximum value for the film prepared with sulfate precursor. The calculated strain was compressive in nature. Surface roughness was estimated from the AFM measurements and found to be decreased in annealed samples. The film deposited with chloride precursor showed a higher visible transmittance of around 80 % and became 90 % on annealing. The variation of packing density follows the variation of the refractive index. The optical band gap of the samples was estimated and found to be within the range of 2.45–2.71 eV, which is in quite agreement with the literature.