Anomalous birefringence of light in free-standing samples of porous silicon |
| |
Authors: | M. E. Kompan J. Salonen I. Yu. Shabanov |
| |
Affiliation: | (1) Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russia;(2) Turku University, Finland |
| |
Abstract: | The birefringence of light in freely suspended samples of porous silicon is observed and investigated. The effect is interpreted as “shape birefringence,” i.e., the effect caused by the structure of a material consisting of anisotropic formations with sizes less than the wavelength of the light and with a predominant orientation. It is checked experimentally that the samples do not possess optical activity or optical anisotropy in the plane of the porous-silicon film. It is determined that the effect is observed for polarization of incident light that rules out the possibility of observing birefringence in a uniform optical medium, and it is not observed in the conventional experimental geometry. Qualitative explanations are given for the anomalous character of the observed defect. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|