Characteristic analysis of a directional coupler in horizontal multiple-slotted silicon wires with slanted sidewalls |
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Authors: | Jinbiao Xiao Wenliang Li Saisai Xia Xiaohan Sun |
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Institution: | Laboratory of Photonics and Optical Communications, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, China |
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Abstract: | The characteristics of the directional couplers based on the horizontal multiple-slotted waveguides with slanted sidewalls are analyzed in detail by using a mode solver based on the full-vectorial finite element method with perfectly matched layers absorbing boundary conditions. The coupling length of the directional coupler as functions of the structural parameters including waveguide spacing, sidewalls angle, the thickness and refractive index of the slot regions, both in quasi-TE and quasi-TM modes, is obtained. The effective indexes and the field distributions of the even and odd modes also are presented. The numerical results show that polarization-independent directional couplers can be realized by properly choosing structural and material parameters. |
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