1. Nexcis Photovoltaic Technology, 190 Avenue Célestin Coq, 13106 Rousset, France;2. Ecole Nationale Supérieure des Mines, CMP-EMSE, MOC, 880 Avenue de Mimet, 13541 Gardanne, France
Abstract:
Laser beam deflectometry was used to follow the growth dynamic of C60 nanorods via an interfacial diffusion and self-assembly phenomenon. The deduced average value of the interfacial diffusion coefficient Dint from the refractive index gradient was found to be of the order of 3.32 10? 6 m2/s.