The influence of Au thickness on the structural,optical and electrical properties of ZnO/Au/ZnO multilayer films |
| |
| Authors: | Daeil Kim |
| |
| Institution: | 1. Department of Physics, College of Education for Pure Science, Ibn Al-Haitham, University of Baghdad, 10071 Baghdad, Iraq;2. Mechanical Engineering Department, Karbala Institute of Technology, Karbala 51214, Iraq;3. Department of Physics, Jahangirnagar University, Savar, Dhaka 1342, Bangladesh;4. Chemical and Metallurgical Engineering and Chemistry, School of Engineering and Information Technology, Murdoch University, 90 South Street, Murdoch, Western Australia 6150, Australia;5. Newcastle University in Singapore, SIT Building @Ngee Ann Polytechnic, 537 Clementi Road #06-01 599493, Singapore;6. John de Laeter Centre, Curtin University, Perth, WA 6102, Australia;7. Department of Chemical Engineering, Universitas Riau, Kampus UNRI, Binawidya Panam, Pekanbaru, Riau 28293, Indonesia;8. School of Engineering, Edith Cowan University, Joondalup, WA 6027, Australia;9. Surface Analysis and Materials Engineering Research Group, Discipline of Chemistry and Physics, College of Science, Health, Engineering and Education, Murdoch University, Murdoch, WA 6150, Australia;1. Centre for Micro and Nano Devices (CMND), Department of Physics, COMSATS University Islamabad, Park Road, Islamabad, 44000, Pakistan;2. School of Chemical and Materials Engineering (SCME), National University of Science and Technology, H-12, Islamabad, Pakistan;1. XLIM institute, UMR 6172, Université de Limoges/CNRS, 123 avenue Albert Thomas, 87060 Limoges, France;2. Fractal Systems Inc, 2009 th Avenue North, Suite 100 Safety Harbor, Florida 34695;1. School of Electronic and Information Engineering, Tianjin University, Tianjin 300072, People’s Republic of China;2. Key Laboratory of Photovoltaic Materials of Henan Province and School of Physics and Electronics, Henan University, Kaifeng 475004, People’s Republic of China;1. Photonics Laboratory, Angers University, 2, Bd. Lavoisier, 49045 Angers, France;2. Faculty of Physics, “Alexandru Ioan Cuza” University of Iasi, Romania;3. National Institute of Materials Physics, Bucharest, Romania |
| |
| Abstract: | Transparent and conductive ZnO/Au/ZnO (ZAZ) multilayer films were deposited on glass substrates by magnetron sputtering without intentional substrate heating. The thickness of Au interlayer was set at 1, 2 and 3 nm.The observed structural, optical and electrical properties were dependent on the thickness of the Au interlayer. For all of the ZAZ films, the diffraction peaks in the XRD pattern were identified as the (002) and (103) planes of a ZnO films and the (111) plane of an Au interlayer. The ZAZ films with a 2 nm thick Au interlayer showed a higher figure of merit than the other ZAZ films prepared in this study, and they also demonstrated the relatively high work function of 5.13 eV.From these results, we concluded that a ZAZ film with a 2 nm thick Au interlayer is an alternative candidate for use as a transparent electrode in OLEDs and various flat panel displays. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
