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Fast and low error color encrypted computer-generated hologram based on amplitude-phase modulation with a random mask for an identification tag application
Authors:Hyunhwan Choi  Ki-Mun Pak  Yong-Hyub Won
Affiliation:1. The School of Science, Hangzhou Dianzi University, Hangzhou, 310018 China;2. Department of Physics, Zhejiang University, Hangzhou, 310027 China;1. Department of Automatic test and Control, Harbin Institute of Technology, Harbin 150001, China;2. Post-doctoral Mobile Station of Electronic Science and Technology, Harbin Institute of Technology, Harbin 150001, China;3. Department of Physics, Harbin Institute of Technology, Harbin 150001, China;4. State Key Laboratory of Information Security, Institute of Information Engineering, Chinese Academy of Sciences, Beijing 100093, China;5. School of Computer Science and Technology, Harbin Institute of Technology, Harbin 150001, China;1. Key Laboratory for Micro-/Nano-Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha 410082, PR China;2. SZU-NUS Collaborative Innovation Center for Optoelectronic Science & Technology, and Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518060, PR China;3. Key Laboratory for Information Science of Electromagnetic Waves, Fudan University, Shanghai 200433, PR China;1. Department of Physics, Amrita School of Engineering, Amrita Vishwa Vidyapeetham, Amrita University, Bangalore 560035, India;2. Department of Sciences, Amrita School of Engineering, Amrita Vishwa Vidyapeetham, Amrita University, Coimbatore 641112, India;1. Department of Space Equipment, The Academy of Equipment, Beijing 101416, China;2. Department of Automation Measurement and Control, Harbin Institute of Technology, Harbin 150001, China
Abstract:A new APM computer-generated hologram algorithm for minimizing DC components and more effective data recovery is presented for the purpose of an ID tag application. In this method, a technique of randomization of the input data is introduced prior to the Fourier transform. As a result, DC components are localized at the center region, which is only 1 data cell, regardless of input data. The size of the tag pattern is reduced 2.25 times using a color encryption technique. Our experimental result through the image captured by a camera also shows that approximately 50% damaged APM-CGH tags can be reconstructed at a low error rate of about 1.8%.
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