A fast,accurate phase unwrapping method for wavelet-transform profilometry |
| |
| Authors: | Feipeng Da Hao Huang |
| |
| Affiliation: | 1. College of Computer Science and Technology, Harbin Engineering University, Harbin 150001, China;2. The Higher Educational Key Laboratory for Measuring & Control Technology and Instrumentations of Heilongjiang Province, Harbin University of Science and Technology, Harbin 150080, China;1. Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China;2. Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education of China. Beijing Institute of Technology, Beijing 100081, China;1. Consejo Nacional de Ciencia y Tecnologia, Av. Insurgentes Sur 1582, 03940 México, D.F., Mexico;2. Optics Department, Instituto Nacional de Astrofisica, Optica y Electronica, Luis Erro 1, 72840 Puebla, Mexico;3. Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli St., Warsaw 02-525, Poland;4. División de Física Aplicada, Centro de Investigación Científica y Educación Superior de Ensenada, Carretera Tijuana-Ensenada No. 3913, B.C. 22860, Mexico;1. Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics, Sichuan, China;2. School of Automation, Wuhan University of Technology, Wuhan, China;3. Shanghai Institute of Measurement and Testing Technology, Shanghai, China;1. Consejo Nacional de Ciencia y Tecnologia, Av. Insurgentes Sur 1582, 03940, México, D.F., Mexico;2. Optics Department, Instituto Nacional de Astrofisica, Optica y Electronica, Luis Erro 1, 72840 Puebla, Mexico;3. Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli St., Warsaw 02-525, Poland;1. College of Computer Science and Technology, Harbin Engineering University, Harbin 150001, China;2. The Higher Educational Key Laboratory for Measuring & Control Technology and Instrumentations of Heilongjiang Province, Harbin University of Science and Technology, Harbin 150080, China;3. College of Mathematics and Informatics, South China Agricultural University, Guangzhou 510642, China |
| |
| Abstract: | A novel phase unwrapping method used in wavelet-transform profilometry is presented to improve the accuracy and speed of the unwrapping process. The wrapped phase of the fringe image is extracted by using wavelet transform. How to establish quality map using scale factor at wavelet ridge is discussed firstly. The proposed method can reflect the reliability of the pixels in fringe image effectively. As the consuming time of traditional flood-fill phase unwrapping algorithm is too long, an improved quality-guided method is used in phase unwrapping process. We divide the wrapped phase map into two levels following the established quality map, and process these two levels using different algorithms. Compared with the traditional flood-fill algorithm, we can get the accurate result while the consuming time of the phase unwrapping process is much less by using the proposed method. Simulation and experiment results verify that the 3D information of the measured object can be obtained rapidly and accurately by using the proposed method. Also the dynamic object can be measured too. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
