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Magnetic and magneto-optical studies on Zn1−xCrxTe (x=0.05) films grown on glass substrate |
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| Authors: | D Soundararajan D Nataraj J Santoyo-Salazar MJ Riley |
| Institution: | a Thin Films and Nanomaterials Laboratory, Department of Physics, Bharathiar University, Coimbatore 641 046, India b Department of Nanoscience and Technology, Bharathiar University, Coimbatore 641 046, India c National Institute of Metrology (TUBITAK-UME), P.K. 54, 41470 Gebze-Kocaeli, Turkey d Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. Ciudad Uuniversitaria AP 70-360, México D.F., 04510, México e Institut de Physique et Chimie des Matériaux de Strasbourg, UMR CNRS-ULP-ECPM 7504, 23, rue du Loess, BP 43, 67034 Strasbourg Cedex 2, France f University of Queensland, School of Molecular Microbial Sciences, St Lucia 4072, Australia |
| Abstract: | Zn1−xCrxTe (x=0.05) films were prepared by thermal evaporation onto glass substrates. X-ray diffraction (XRD) was used to determine the crystalline quality of the ZnTe:Cr film. Magnetic force microscopy (MFM) investigation has shown a non-uniform distribution of magnetic domains with an average size of 4 nm at room temperature. SQUID measurements have further shown that the non-uniform distribution of domains does not affect the room temperature ferromagnetism of this material. Electron spin resonance spectroscopy (ESR) was done to determine the Cr valence state in the ZnTe lattice. Magnetic circular dichroism (MCD) analysis was used to confirm the ZnCrTe phase contributing to the ferromagnetic behavior. |
| Keywords: | ZnTe:Cr film Magnetic domains M vs H curve Magneto-optical study |
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