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Persistent photoconductivity and thermally stimulated current related to electron-irradiation induced defects in single crystal ZnO bulk |
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| Authors: | K. Kuriyama K. Matsumoto Y. Suzuki K. Kushida Q. Xu |
| Affiliation: | 1. National Institute for R & D in Microtechnologies (IMT), Erou Iancu Nicolae Str. 126A, Bucharest, 077190, Romania;2. University of Bucharest, Faculty of Physics, Atomistilor Str. 405, 077125 Magurele, Ilfov, Romania |
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