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Shot noise measurements in graphene
Authors:R. Danneau  F. Wu  M.F. Craciun  S. Russo  M.Y. Tomi  J. Salmilehto  A.F. Morpurgo  P.J. Hakonen
Affiliation:1. Low Temperature Laboratory, Helsinki University of Technology, Espoo, Finland;2. Kavli Institute of Nanoscience, Delft University of Technology, Delft, The Netherlands;3. DPMC and GAP, University of Geneva, quai Ernest-Ansertmet 24, CH1211 Geneva, Switzerland;1. School of Physics, The Georgia Institute of Technology, Atlanta, GA 30332-0430, USA;2. Institute for Advanced Materials Devices and Nanotechnology, Rutgers University, Piscataway, NJ 08854, USA;3. Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN 55455, USA;4. RAMIS/SPCSI/LENSIS, F-91191 Gif-sur-Yvette, France;5. Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Trieste, Italy;1. Department of Physics, Faculty of Sciences, University of Mohaghegh Ardabili, P.O. Box, 179, Ardabil, Iran;2. Department of Engineering Sciences, Faculty of Advanced Technologies, University of Mohaghegh Ardabili, Namin, Iran;1. Departamento de Física, Facultad de Ciencias, Universidad de Extremadura, E-06071 Badajoz, Spain;2. BIFI, Universidad de Zaragoza, E-50009 Zaragoza, Spain;3. DIIS and BIFI, Facultad de Ciencias, Universidad de Zaragoza, E-50009 Zaragoza, Spain;1. College of Applied Sciences, Beijing University of Technology, Beijing 100122, China;2. Department of Physics, Tsinghua University, Beijing 100084, China
Abstract:
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